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昆山General purpose atomic force microscope AFM5100N

昆山General purpose atomic force microscope AFM5100N

  • Classification:昆山unit
  • Number of Views:second
  • Date of issue:2021-11-18 10:59:25
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In addition to the laser detection method, the AFM5100N has a new "self-inspection cantilever" that greatly simplifies the operation of the AFM cantilever while ensuring high-resolution surface topography observation.
  • characteristic
  • Specifications
  • option
  • function
  • Observation example

◆ 1. Easy cantilever installation

The usual cantilever is very small and difficult to operate. The "self-detection cantilever" with a sensor inside is much larger than the ordinary AFM probe, it is easy to take, and the installation is very simple and convenient.

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◆ 2. Self-detection method without adjusting the laser spot


The probe of the laser detection method needs to adjust the position of the laser spot, which is complicated to operate, while the "self-detection cantilever" adopting the self-detection method does not need to adjust the laser spot.

◆ 3. Accurate cantilever positioning


The mechanical structure of the cantilever can directly observe the position of the cantilever in a top view, so as to easily adjust the measurement position of the sample. In addition, sharper probes improve resolution.



◆ 4. Convenient operation navigation system


Through the navigation system in the form of a flowchart, anyone can easily perform high-resolution surface measurements. In addition, the measurement conditions can be easily determined by setting parameters such as the hardness and unevenness of the sample.

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◆ 5. Compact host


The main unit contains accessories such as shock absorption table, soundproof cover, optical microscope, etc., which is compact in installation and small in size.



◆ 6. Superior extended functions


Through the laser detection method, various optional functions can be expanded. In addition, you can switch to the laser detection mode by simply plugging and unplugging a cable.

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