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Thermal field emission scanning electron microscope SU5000

Thermal field emission scanning electron microscope SU5000

  • Classification:Field emission scanning electron microscope (FE-SEM)
  • Number of Views:second
  • Date of issue:2021-11-18 11:30:12
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◆ High-performance electronic optical system


image.png Secondary electron resolution: Top secondary electron detector (2.0 nm at 1kV)*


image.png High sensitivity: High efficiency PD-BSD, super low acceleration voltage performance, imaging as low as 100 V


image.png Large beam current (>200 nA): convenient for efficient micro-area analysis


◆ Excellent performance


image.png Variable pressure: Excellent low vacuum (10 -300 Pa) imaging performance, equipped with high sensitivity low vacuum detector (UVD)*


image.png Quick and easy sample change in opening room (sample size: Φ 200 mm x 80 mmH)


image.png Micro area analysis: EDS, WDS, EBSD, etc.


*: Optional accessories



*1: Deceleration function (including high-resolution top secondary electron detector)


*2: Low vacuum function (including 5-segment semiconductor detector)


*3: Air compressor (local purchase)


样品: 氧化锌粉末

着陆电压: 1 kV ; 倍率: 120,000x

低电压下顶位二次电子探测器成像样品: 氧化锌粉末

着陆电压: 1 kV ; 倍率: 120,000x

低电压下顶位二次电子探测器成像


样品: PTFE

加速电压: 3 kV ; 倍率: 13,000x

UVD探测器可在低加速电压(3 kV)和低真空

(40 Pa) 下获得高质量图像


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