Desktop microscope TM4000II/TM4000PlusII

Classification:Desktop electron microscope
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Date of issue:2021-11-18 11:14:37

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The desktop scanning electron microscope (SEM) is newly upgraded. We developed the TM4000 series with the concept of "higher image quality, easier to use, and easier to observe". On this basis, we have launched the TM4000Ⅱ series with more diverse functions. Provide you with new observation and analysis applications.

characteristic
Specifications
option
function
Observation example

◆ Observe the image for 3 minutes. The required data can be obtained quickly and reports can be made.

Observation and analysis flexibility

Obtain all kinds of data automatically. Switch quickly!

Quickly obtain the element distribution map*2

*1 The function of TM4000PlusⅡ. *2Optional

With Camera Navi*, it’s that simple

Camera Navi image allows you to easily find the field of view, the distribution map (MAP) function supports your observation throughout the process

*Optional: Camera Navi system

You can also watch the video

Simple and fast operation

It only takes 3 minutes to observe the image.

You can quickly observe the image and export the test report.

Report Creator allows you to easily create reports

You can create reports in Microsoft Word, Excel, and PowerPoint formats by simply selecting images and templates

◆ Even the insulation samples can be observed directly without pretreatment.

"Static Reduction Mode" can suppress static electricity

For samples that are prone to static electricity, you can use the "static electricity reduction mode" to observe in a state where static electricity is suppressed.

Simply click on the software with the mouse to switch to the "static reduction mode".

Various observations can be performed under low vacuum conditions

For samples that are prone to static electricity, such as powder or water, the observation can be combined with its purpose.

◆ The secondary electron image (surface shape) can be observed under low vacuum conditions.

No pretreatment is required, and the surface of insulators and water-containing and oily samples can also be observed

Not only to observe traditional conductive samples, but also to observe insulators and water-containing and oily samples without pretreatment. It can quickly switch between the secondary electron image and the backscattered electron image.

High sensitivity low vacuum secondary electron detector

Using high sensitivity low vacuum secondary electron detector (UVD). By detecting the light generated by the collision between electron beams and residual gas molecules, images with secondary electron information can be observed. In addition, by controlling the detector to detect the light generated by the electron irradiation, CL information (UVD-CL: Image with CL information) can be obtained.

The detection principle of high sensitivity low vacuum secondary electron detector

◆ Support acceleration voltage 20 kV

TM4000Ⅱ/TM4000Plus II can support an acceleration voltage of 20 kV.

With EDS analysis (optional), higher counting rate analysis can be performed.

By accelerating voltage of 20 kV, high S/N of the EDS element distribution map is realized

◆ Multi Zigzag (optional)

It can realize SEM observation in a wide area.

With automatic motor stage, low magnification, high precision, and large-scale observation and analysis can be realized.

◆ EM sample table (optional)

Easily observe STEM images

With the newly developed STEM sample stage and high-sensitivity low-vacuum secondary electron detector (UVD), it can easily observe small-magnification STEM images.

Easily observe film samples and biological samples.