MirrorCLEM is a CLEM*1 system that can easily observe the same position of an optical microscope and a scanning microscope.

*1: CLEM (Correlative light and electron microscopy): Combined observation microscope method of optical microscope and electron microscope

MirrorCLEM is a system that supports CLEM analysis quickly and accurately with FE-SEM.

Using this system, after clearly observing the target structure of resin slices from low magnification to high magnification under an optical microscope, the observation position is synchronized with the coordinate information of the FE-SEM sample stage, and the same position can be observed on the FE-SEM by controlling the motor stage.

In addition, the superimposed image of the optical microscope and FE-SEM can be displayed in real time.