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淮安Spherical aberration correction scanning transmission electron microscope HD-2700

淮安Spherical aberration correction scanning transmission electron microscope HD-2700

  • Classification:淮安Transmission Electron Microscope (TEM/STEM)
  • Number of Views:second
  • Date of issue:2021-11-18 10:42:32
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The dedicated scanning transmission microscope HD-2700 is equipped with a spherical aberration corrector jointly developed with German CEOS GmbH (Mr. Max Haider, General Manager), which significantly improves the performance of scanning transmission electron microscopes and is more suitable for advanced nanotechnology research. Since the spherical aberration correction system corrects the spherical aberration that limits the performance of the electron microscope, compared with the standard model microscope, the resolution is increased by 1.5 times, and the probe current is increased by 10 times.
  • characteristic
  • Specifications
  • option
  • function
  • Observation example

◆ High-resolution scanning transmission electron microscope imaging

image.pngHAADF-STEM image 0.136 nm, FFT image 0.105 nm (high resolution lens*)

image.pngHAADF-STEM image 0.144 nm (standard lens)

image.png Bright field scanning transmission electron microscope image 0.204 nm (w/o spherical aberration corrector)


 High-speed, high-sensitivity energy spectrum analysis: probe current × 10 times

image.png Element surface distribution is more rapid and timely

image.png Low concentration element detection


◆ Simplified operation

image.png Automatic image centering function


◆ Seamless connection from sample preparation to observation and analysis

image.png Sample holder is compatible with Hitachi focused ion beam system


 Equipped with various options to perform various evaluation and analysis operations

image.png Simultaneously acquire and display SE&BF, SE&DF, BF&DF, DF/EDX surface distribution* and DF/EELS surface distribution* images.

image.png Low-dose function* (reduce the damage and contamination of the sample to a low level)

image.png image.png High-precision magnification, calibration and measurement*


image.png image.png Real-time diffraction unit* (simultaneous observation of dark-field-scanning transmission electron microscope images and diffraction patterns)


image.png image.png Rotating sample rod with three-dimensional micro-column (360 degree rotation)*, with automatic tilt image acquisition function.


image.png image.png ELV-3000 real-time element surface distribution system* (acquire darkfield-scanning transmission electron microscope images at the same time)


◆ HD-2700 Spherical Aberration Correction Scanning Transmission Electron Microscope


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