◆ High-resolution scanning transmission electron microscope imaging

HAADF-STEM image 0.136 nm, FFT image 0.105 nm (high resolution lens*)

HAADF-STEM image 0.144 nm (standard lens)

 Bright field scanning transmission electron microscope image 0.204 nm (w/o spherical aberration corrector)

◆ High-speed, high-sensitivity energy spectrum analysis: probe current × 10 times

 Element surface distribution is more rapid and timely

 Low concentration element detection

◆ Simplified operation

 Automatic image centering function

◆ Seamless connection from sample preparation to observation and analysis

 Sample holder is compatible with Hitachi focused ion beam system

◆ Equipped with various options to perform various evaluation and analysis operations

 Simultaneously acquire and display SE&BF, SE&DF, BF&DF, DF/EDX surface distribution* and DF/EELS surface distribution* images.

 Low-dose function* (reduce the damage and contamination of the sample to a low level)

 image.png High-precision magnification, calibration and measurement*

 image.png Real-time diffraction unit* (simultaneous observation of dark-field-scanning transmission electron microscope images and diffraction patterns)

 image.png Rotating sample rod with three-dimensional micro-column (360 degree rotation)*, with automatic tilt image acquisition function.

 image.png ELV-3000 real-time element surface distribution system* (acquire darkfield-scanning transmission electron microscope images at the same time)

◆ HD-2700 Spherical Aberration Correction Scanning Transmission Electron Microscope