Ultim Max TLE

Our flagship SDD energy spectrum detector of TEM has been designed and optimized to increase the counting rate under small beam spots and can characterize elemental information at the atomic scale.

This performance is achieved through optimized crystal shape, 100mm2 large area crystal, windowless structure, optimized mechanical design and Extreme electronic components.

0.5-1.1srad solid angle

Sensitivity to low-energy x-rays can be increased by 8 times

Quantitative analysis can be performed at a count rate of 400,000 cps

In in-situ experiments, spectra are collected at temperatures as high as 1000°C

Ultim Max TEM

SDD energy spectrum detector for nano-scale analysis and element surface distribution.

In any case, the use of the new mid-end 80mm2 sensor can be closer to the sample and provide more X-ray counts. Combining windowless design and low-noise electronic components, it provides high-quality data for EDS analysis at 200kV.

0.2-0.6 srad solid angle

Sensitivity to low-energy x-rays can be increased by 8 times

Quantitative analysis can be performed at a count rate of 400,000 cps

In in-situ experiments, spectra are collected at temperatures as high as 1000°C

Xplore TEM

SDD energy spectrum detector specially designed for routine applications of 120kV and 200kV TEM.

Using the new 80 mm2 sensor, thin polymer window and low-noise electronic components, it provides fast and accurate element characterization.

Solid angle of 0.1-0.4 srad

Element detection from Be to Cf

Quantitative analysis can be performed at a count rate of 200,000 cps

SATW window provides greater convenience for a wide range of applications

After-sales service

Free on-site installation: No

Warranty period: consult the engineer for details

Can the warranty period be extended: Yes

Warranty maintenance commitment: consult the engineer for details

Commitment to repair: consult the engineer for details

Free instrument maintenance: consult the engineer for details

Free training: consult the engineer for details

On-site technical consultation: Yes