The transmission electron microscope is a scientific instrument that uses high-energy electron beams to study objects on a very fine scale. In scanning electron microscopy (SEM), a high-energy concentrated electron beam is used instead of light to form an image. From this, morphological information (surface characteristics of the object), morphological information (the shape and size of the particles that make up the object), composition information (the elements and compounds that make up the object and their amounts) and crystal information (the atoms in the object) can be obtained. arrangement).

Today, I will introduce the shortcomings of transmission electron microscope:

1. In the electron microscope, the sample must be observed in a vacuum, so it is impossible to observe the live sample. With the advancement of technology, the environmental scanning electron microscope will gradually realize the direct observation of the live sample;

2. When processing the sample, there may be a structure that the sample does not have, which intensifies the difficulty of analyzing the image afterwards;

3. Due to the extremely strong electron scattering ability, second-order diffraction is prone to occur;

4. Because it is a two-dimensional plane projection image of a three-dimensional object;

5. Since the transmission electron microscope can only observe very thin samples, it is possible that the structure of the surface of the substance is different from the structure of the substance;

6. For ultra-thin samples (below 100 nanometers), the transmission electron microscope process of sample preparation is complicated and difficult, and the sample preparation is damaged;

7. The electron beam may damage the sample through collision and heating;

8. In addition, the purchase and maintenance prices of electron microscopes are relatively high.